The Radio Frequency Admittance Level Gauge is an advanced level measurement technology that improves upon traditional capacitive methods by offering enhanced reliability, accuracy, and versatility. This cutting-edge technology is specifically designed to address challenges such as material build-up, temperature drift, and the limitations of cable shielding.
In radio frequency admittance, "admittance" is the reciprocal of impedance, which involves resistive, capacitive, and inductive components. High-frequency radio waves are used to measure this admittance, making the technology highly effective for various industrial applications. Unlike traditional capacitive sensors, this technology overcomes issues like material accumulation at the sensor base, ensuring consistent and reliable measurements.
Product Features:
Advanced Circuit Design: The unique circuit design enables the measuring circuit to automatically correct for any objects or material build-up on the probe, ensuring accurate measurements without interference.
Cable-Free Design: With no cable connections, this device is easy to install and remove, allowing for hassle-free installation and minimal disruption to ongoing operations.
RF and Digital Technology: Incorporating RF (Radio Frequency) and digital technology significantly enhances the reliability and performance of the system, ensuring accurate and stable measurements.
Durability: The sensor has a long service life, with no mechanical wear and tear, making it a highly durable solution for continuous operation in demanding environments.
Technical Parameters
Operating Power: 12～40VDC
Operating Temperature: -40~70℃
Probe Working (Medium) Temperature: -180℃~850℃ (up to 850°C)
Output Signal: 4-20mA
Response Time: Standard 0.2 seconds, adjustable from 0.5 to 30 seconds
Probe Length: 0.1m～20m
Probe Material: SUS304/SUS316, Ceramic, PPS, PTFE
Brown-Out Protection: High and low modes, field adjustable
Protection Class: IP66 for outdoor installation
Connection Method: NPT thread mount, flange mount (optional)
Click to consult us